Advanced Process Control, Big Data and Industry 4.0: Key Themes for 2016 Conferences
By Nanochip Staff
During 2016, two premier conferences targeting Advanced Process Control (APC) technologies will focus on challenges and solutions in microelectronics related to the advancement of APC in leveraging big data and Industry 4.0 concepts. The annual Advanced Semiconductor Manufacturing Conference (ASMC) will be held in Saratoga Springs, New York, May 16 – 19; and the 28th U.S. Advanced Process Control (APC) Conference will convene in Mesa, Arizona, October 17-20.
It is hard to believe that APC has been on the microelectronics industry map for over a quarter-century. Throughout that time the U.S. APC Conference has been a premier showcase for the latest APC innovations for microelectronics manufacturing. The Advanced Semiconductor Manufacturing Conference (ASMC), now in its 28th year, has been the conference for presenting APC results as a component of a wider set of advanced manufacturing solutions.
In recent years, the industry has seen a resurgence in research and development in APC, leveraging new technologies such as big data and Industry 4.0 (often referred to as “smart manufacturing”). These technologies allow us to store and process much larger amounts of data in the fab much more quickly, enable prognostic technologies such as predictive maintenance and virtual metrology, leverage the internet of things and internet of services for a much more comprehensive integrated solution, and move toward cyberphysical systems that blend the real and virtual worlds in manufacturing for improved quality at lower cost. Through these two premier conferences, attendees have an unprecedented opportunity to learn about these trends and discuss challenges and solutions with their peers. Here are some details:
The Advanced Semiconductor Manufacturing Conference 2016 is being held May 16-19 at the Hilton Hotel in Saratoga Springs, New York. Sponsored by SEMI, the conference provides the latest information on the practical application of advanced manufacturing strategies and methodologies, including advanced APC concepts. It will begin with a keynote on advanced manufacturing from GE Global Research, followed by sessions covering topics such as defect inspection, advanced equipment and metrology, factory optimization, yield enhancement, and, of course, APC.
One of the highlights of this year’s conference will be the presentation of Best Paper Awards from last year’s conference…and the winners are:ASMC 2015 Best Paper Award: "Big Data Emergence in Semiconductor Manufacturing Advanced Process Control" by James Moyne, Jamini Samantaray, Mike Armacost, Applied Materials; and
ASMC 2015 Best Student Paper Award: "Inspection Step Modeling for Defect Source Tool Identification Using Defectivity Control" by Mohamad Chakaroun, Rabah Messouci, Mohand Djeziri, Mustapha Ouladsine, Aix Marseille Universite, CNRS, ENSAM, Universite de Toulon; Jacques Pinaton, Process Control System, STMicroelectronics.
The APC Conference XXVIII 2016 is being held October 17-20 at the Hilton Hotel in Mesa, Arizona (just outside of Phoenix), and is a great place to learn more about advanced APC technologies, share ideas and connect with colleagues. The APC First Call for Papers was issued on March 4, 2016, with abstract submissions due by July 15, 2016.
The conference showcases innovations in both traditional and advanced APC concepts including predictive maintenance, virtual metrology, big data and smart manufacturing. Other topics covered include defect inspection and management, factory optimization, yield enhancement, cloud integration, green technologies, and technology trends, standards and roadmaps.
The APC conference is underwritten by the Integrated Measurement Association (IMA), which has organized the event for the past five years.
Get Involved! The APC world is changing fast, with issues like big data, smart manufacturing and cyber-physical systems now a regular part of the APC technology roadmap. Keep up to date with the technology and let the world hear about your innovations. Attend the conferences to learn more or, better yet, submit an abstract on your work to the APC Conference and be part of the global APC innovation team in microelectronics.
For additional information contact Michael_D_Armacost@amat.com.