skip to main content

nanochip fab solutions

随着器件功耗的增加,氮化镓技术 正走向成熟

作者:Llew Vaughan-Edmunds


Read More

Enhanced Fault Detection Comes to Semiconductor Assembly, Test and Packaging

By Chris Reeves and Ben Williams

Applied Materials’ new Applied SmartFactory® Fault Detection solution offers an economic, easy-to-implement way to improve tool and process performance in the back end.

Read More

将工厂质量 提升至新的高度

作者: Selim Nahas


Read More

Digital Tools Enable Service Products

By Joseph Farah

Since its founding in 1967, Applied Materials has been developing technologies that enable customers to build the world’s most-advanced semiconductor devices.

Read More

Virtual APC Embraces Smart Manufacturing

By Nanochip Staff

APC Conference goes virtual and expands its scope to encompass evolving smart manufacturing and Industry 4.0 topics; premier technical forum now called the Advanced Process Control Smart Manufacturing (APCSM) Conference.

Read More